
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
出版:International Electrotechnical Committee

专家解读视频
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
出版:International Electrotechnical Committee
专家解读视频