IEC 60749-29 : 2.0现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 29: LATCH-UP TEST
出版：International Electrotechnical Committee
专家解读视频
Covers the I-test and the overvoltage latch-up testing of integrated circuits.
NBR IEC 60749-29 : 2011 - Identical
BS EN 60749-29 : 2011 - Identical
DS EN 60749-29 : 2011 - Identical
I.S. EN 60749-29:2011 - Identical
CEI EN 60749-29 : 2012 - Identical
PN EN 60749-29 : 2011 - Identical
NEN EN IEC 60749-29 : 2011 - Identical
DIN EN 60749-29 : 2012 - Identical
