NF EN 60749-35:2006现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 35: Acoustic Microscopy For Plastic Encapsulated Electronic Components
出版：Association Francaise de Normalisation
专家解读视频
Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components.
Indice de classement: C96-022-35 PR NF EN 60749-35 October 2005. (10/2005)
NBN EN 60749-35:2007 - Identical
DIN EN 60749-35 (2007-03) - Identical
BS EN 60749-35:2006 - Identical
EN 60749-35:2006 - Identical
SS EN 60749-35 Ed. 1 (2006) - Identical
I.S. EN 60749-35:2006 - Identical
IEC 60749-35 Ed. 1.0 - Identical
