BS EN 60749-35:2006现行
Semiconductor devices. Mechanical and climatic test methods. Acoustic microscopy for plastic encapsulated electronic components
出版：British Standards Institution
专家解读视频
Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components.
© British Standards Institution 2013
NF EN 60749-35:2006 - Identical
NBN EN 60749-35:2007 - Identical
DIN EN 60749-35 (2007-03) - Identical
DIN EN 60749-35 : 2007 - Identical
I.S. EN 60749-35:2006 - Identical
IEC 60749-35 : 1.0 - Identical
NF EN 60749-35 : 2006 - Identical
NBN EN 60749-35 : 2007 - Identical
DIN EN 60749-35 : 2007 - Identical
I.S. EN 60749-35:2006 - Identical
EN 60749-35 : 2006 - Identical
I.S. EN 60749-35:2006 - Identical
IEC 60749-35 Ed. 1.0 - Identical
SS EN 60749-35 Ed. 1 (2006) - Identical
EN 60749-35:2006 - Identical
