DIN EN 60749-35 (2007-03)现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 35: Acoustic Microscopy For Plastic Encapsulated Electronic Components
出版：German Institute for Standardisation (Deutsches Institut für Normung)
专家解读视频
Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components.
Supersedes DIN IEC 60749-35. (03/2007)
EN 60749-35:2006 - Identical
SS EN 60749-35 Ed. 1 (2006) - Identical
IEC 60749-35 Ed. 1.0 - Identical
I.S. EN 60749-35:2006 - Identical
NF EN 60749-35:2006 - Identical
NBN EN 60749-35:2007 - Identical
BS EN 60749-35:2006 - Identical
