NBN EN 60749-35:2007现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 35: Acoustic Microscopy For Plastic Encapsulated Electronic Components
出版：Belgian Standards
专家解读视频
Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components.
I.S. EN 60749-35:2006 - Identical
NF EN 60749-35:2006 - Identical
DIN EN 60749-35 : 2007 - Identical
I.S. EN 60749-35:2006 - Identical
DIN EN 60749-35 : 2007 - Identical
BS EN 60749-35 : 2006 - Identical
SS EN 60749-35 Ed. 1 (2006) - Identical
EN 60749-35:2006 - Identical
BS EN 60749-35:2006 - Identical
DIN EN 60749-35 (2007-03) - Identical
