NBN EN 60749-32 : 2004 AMD 1 2010现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)
出版：Belgian Standards
专家解读视频
Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to external heating.
SN EN 60749-32 : 2003 - Identical
I.S. EN 60749-32:2003 - Identical
BS EN 60749-32 : 2003 - Identical
DIN EN 60749-32 : 2011 - Identical
DIN EN 60749-32 : 2011 - Identical
