I.S. EN 60749-4:2002被替代
Semiconductor Devices - Mechanical And Climatic Test Methods Part 4: Damp Heat, Steady State, Highly Accelerated Stress Test (hast)
出版：National Standards Authority of Ireland
专家解读视频
Gives a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
UNE EN 60749-4:2003 - Identical
SS EN 60749-4 Ed. 1 (2003) - Identical
IEC 60749-4 Ed. 1.0 - Identical
NF EN 60749-4:2002 - Identical
NBN EN 60749-4:2003 - Identical
DIN EN 60749-4 (2003-04) - Identical
BS EN 60749-4:2002 - Identical
EN 60749-4:2017 - Identical
