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标准编号	标准名称	发布部门	发布日期	状态
IEC 60146-1-1 Ed. 4.0	Semiconductor converters - General requirements and line commutated converters Part 1-1: Specification of basic requirements	Internatio..	2009-06-29	现行
NF EN 62047-6:2009	Semiconductor Devices - Micro-electromechanical Devices - Part 6: Axial Fatigue Testing Methods Of Thin Film Materials	Associatio..	2009-03-01	被替代
DIN 50451-5 (2008-09)	Testing Of Materials For Semiconductor Technology - Determination Of Trace Elements In Liquids - Part 5: Guideline For The Selection Of Materials And Testing Of Their Suitability For Apparatus For Sampling And Sample Preparation For The Determination Of Trace Elements In The Range Of Micrograms Per Kilogram And Nanograms Per Kilogram	German Ins..	2008-09-01	被替代
KS D 0078:2008	Test method for determination of impurity concentrations in silicon crystal by photoluminescence spectroscopy	Korean Sta..	2008-06-30	现行
ASTM F76-08	Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors	American S..	2008-06-15	被替代
ASTM D3004-08	Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials	American S..	2008-05-01	被替代
ASTM F1404-92(2007)	Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique	American S..	2007-12-01	废止
SANS 6284-2 Ed. 2 (2007)	Test Methods For Cross-linked Polyethylene (xlpe) Insulated Electric Cables - Part 2: Tests On Extruded Semi-conducting Screens	South Afri..	2007-08-03	被替代
NF EN 62047-4:2007	Semiconductor Devices - Micro-electromechanical Devices - Part 4: Generic Specifications For Mems	Associatio..	2007-07-01	被替代
KS D ISO TR 12662:2006	Certification scheme for prestressing steels	Korean Sta..	2006-12-18	被替代
ASTM E1438-06	Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS	American S..	2006-11-01	被替代
NF EN 62047-2:2006	Semiconductor Devices - Micro-electromechanical Devices - Part 2: Tensile Testing Methods Of Thin Film Materials	Associatio..	2006-11-01	现行
NF EN 62047-3:2006	Semiconductor Devices - Micro-electromechanical Devices - Part 3: Thin Film Standard Test Piece For Tensile Testing	Associatio..	2006-11-01	现行
ASTM D6095-06	Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials	American S..	2006-04-01	被替代
KS D ISO TR 11637:2005	Boron treated engineering steels for quenching and tempering	Korean Sta..	2005-12-27	被替代
ASTM D6095-05	Standard Test Method for Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials	American S..	2005-03-01	被替代
KS D ISO 90-2:2004	Light gauge metal containers -Definitions and determination of dimensions and capacities -Part 2 General use containers	Korean Sta..	2004-12-03	被替代
KS D ISO 90-3:2004	Light gauge metal containers-Definitions and determination of dimensions and capacities-Part 3:Aerosol cans	Korean Sta..	2004-12-03	被替代
ASTM E161-00(2004)	Standard Specification for Precision Electroformed Sieves	American S..	2004-10-01	被替代
KS M 8527:2004	Potassium 1, 2-naphthoquinone-4-sulfonate	Korean Sta..	2004-09-04	被替代

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