
Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
出版:American Society for Testing and Materials

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基本信息
标准编号: ASTM E1438-06
发布时间:2006/11/1 0:00:00
标准类别:Standard
出版单位:American Society for Testing and Materials
标准页数:2
标准简介
CONTAINED IN VOL. 03.05, 2006Provides the SIMS analyst with a method for determining the width of interfaces from SIMS sputtering data obtained from analyses of layered specimens.
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