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标准编号	标准名称	发布部门	发布日期	状态
DIN 50451-7 (2017-02)	Testing Of Materials For Semiconductor Technology - Determination Of Traces Of Elements In Liquids - Part 7: Determination Of 31 Elements In High-purity Hydrochloric Acid By Icp-ms	German Ins..	2017-02-01	现行
DIN SPEC 1994 (2017-02)	Testing Of Materials For Semiconductor Technology - Determination Of Anions In Weak Acids	German Ins..	2017-02-01	现行
ASTM F980-16	Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices	American S..	2016-12-01	现行
DIN SPEC 1994 (2016-07)	Testing Of Materials For Semiconductor Technology - Determination Of Anions In Weak Acids	German Ins..	2016-07-01	被替代
ASTM F76-08(2016)e1	Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors	American S..	2016-05-01	现行
ASTM F76-08(2016)	Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors	American S..	2016-05-01	被替代
NF EN 62047-22:2014	Semiconductor Devices - Micro-Electromechanical Devices - Part 22: Electromechanical Tensile Test Method For Conductive Thin Films On Flexible Substrates	Associatio..	2014-12-01	现行
DIN 50451-3 (2014-11)	Testing Of Materials For Semiconductor Technology - Determination Of Traces Of Elements In Liquids - Part 3: Determination Of 31 Elements In High-purity Nitric Acid By Icp-ms	German Ins..	2014-11-01	现行
DIN 50451-6 (2014-11)	Testing Of Materials For Semiconductor Technology - Determination Of Traces Of Elements In Liquids - Part 6: Determination Of 36 Elements In A High-purity Ammonium Fluoride Solution (nh[4]f) And In Etching Mixtures Of High-purity Ammonium Fluoride Solution Containing Hydrofluoric Acid	German Ins..	2014-11-01	现行
NF EN 62047-11:2014	Semiconductor Devices - Micro-Electromechanical Devices - Part 11: Test Method For Coefficients Of Linear Thermal Expansion Of Free-Standing Materials For Micro-Electromechanical Systems	Associatio..	2014-03-01	现行
CEI EN 60146-1-1 Ed. 2 (2013)	Semiconductor Converters - General Requirements And Line Commutated Converters - Part 1-1: Specification Of Basic Requirements	Comitato E..	2013-11-01	现行
KS L 1619:2013	Testing methods for resistivity of conductive fine ceramic thin films with four point probe array	Korean Sta..	2013-10-26	现行
NF EN 62047-22:2013		Associatio..	2013-06-01	被替代
ASTM F615M-95(2013)	Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)	American S..	2013-05-01	现行
SANS 6284-2 Ed. 2.01 (2012)	Test Methods For Cross-Linked Polyethylene (Xlpe) Insulated Electric Cables - Part 2: Tests On Extruded Semi-Conducting Screens	South Afri..	2012-12-19	现行
ASTM D6095-12	Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials	American S..	2012-11-01	现行
DIN 50451-6 (2012-11)	Testing Of Materials For Semiconductor Technology - Determination Of Traces Of Elements In Liquids - Part 6: Determination Of 36 Elements In A High-purity Ammonium Fluoride Solution (nh[4]f) And In Etching Mixtures Of High-purity Ammonium Fluoride Solution Containing Hydrofluoric Acid	German Ins..	2012-11-01	被替代
NF EN 62047-11:2012		Associatio..	2012-05-01	被替代
NF EN 62047-9:2012	Semiconductor Devices - Micro-Electromechanical Devices - Part 9: Wafer To Wafer Bonding Strength Measurement For Mems	Associatio..	2012-04-01	现行
ASTM E1438-11	Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS	American S..	2011-11-01	现行

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