NF EN 60749-20:2003被替代
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 20: Resistance Of Plastic-encapsulated Smds To The Combined Effect Of Moisture And Soldering Heat
出版：Association Francaise de Normalisation
专家解读视频
Applies to semiconductor devices (discrete devices and integrated circuits). It provides a means of assessing the resistance to soldering heat of plastic-encapsulated surface mount devices (SMDs).
Indice de classement: C96-022-20PR. (12/2003) Supersedes NF EN 60749. (06/2007) PR NF EN 60749-20 September 2007. (09/2007)
EN 60749-20:2009 - Identical
BS EN 60749-20:2003 - Identical
DIN EN 60749-20 (2003-12) - Identical
NBN EN 60749-20:2004 - Identical
I.S. EN 60749-20:2003 - Identical
IEC 60749-20 Ed. 1.0 - Identical
SS EN 60749-20 Ed. 1 (2003) - Identical
UNE EN 60749-20:2004 - Identical
