IEC 60749-7 Ed. 1.0被替代
Semiconductor devices - Mechanical and climatic test methods Part 7: Internal moisture content measurement and the analysis of other residual gases
出版：International Electrotechnical Committee
专家解读视频
Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. The contents of the corrigendum of August 2003 have been included in this copy.
OVE/ONORM EN 60749-7:2003 - Identical
NEN EN IEC 60749-7:2002 - Identical
PN EN 60749-7:2004 - Identical
I.S. EN 60749-7:2002 - Identical
NF EN 60749-7:2002 - Identical
BS EN 60749-7:2002 - Identical
CEI EN 60749-7 Ed. 1 (2004) - Identical
DIN EN 60749-7 (2003-04) - Identical
UNE EN 60749-7:2003 - Identical
Amd 14111 (Corr to BS EN 60749-7:2002) - Identical
