
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 7: Internal Moisture Content Measurement And The Analysis Of Other Residual Gases
出版:Association Francaise de Normalisation

专家解读视频
Applicable to test and measure the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device.
Indice de classement: C96-022-7PR. (03/2003) Supersedes NF EN 60749. (06/2007) PR NF EN 60749-7 November 2009. (11/2009)
UNE EN 60749-7:2003 - Identical
IEC 60749-7 Ed. 1.0 - Identical
NBN EN 60749-7:2011 - Identical
BS EN 60749-7:2002 - Identical
DIN EN 60749-7 (2003-04) - Identical
NBN EN 60749-7:2003 - Identical
I.S. EN 60749-7:2002 - Identical