
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 7: Internal Moisture Content Measurement And The Analysis Of Other Residual Gases
出版:German Institute for Standardisation (Deutsches Institut für Normung)

专家解读视频
Applicable to test and measure the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device.
Supersedes DIN EN 60749 (06/2005) DRAFT 2009 issued in October 2009. (11/2009)
UNE EN 60749-7:2003 - Identical
IEC 60749-7 Ed. 1.0 - Identical
I.S. EN 60749-7:2002 - Identical
NF EN 60749-7:2002 - Identical
NBN EN 60749-7:2003 - Identical
BS EN 60749-7:2002 - Identical
NBN EN 60749-7:2011 - Identical