I.S. EN 60749-7:2002被替代
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 7: Internal Moisture Content Measurement And The Analysis Of Other Residual Gases
出版：National Standards Authority of Ireland
专家解读视频
Applies to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.
UNE EN 60749-7:2003 - Identical
IEC 60749-7 Ed. 1.0 - Identical
NF EN 60749-7:2002 - Identical
NBN EN 60749-7:2003 - Identical
DIN EN 60749-7 (2003-04) - Identical
BS EN 60749-7:2002 - Identical
