SS EN 60749-10 Ed. 1 (2003)现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 10: Mechanical Shock
出版：Standardiserings-Kommissionen I Sverige
专家解读视频
Specifies a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation.
BS EN 60749-10:2002 - Identical
DIN EN 60749-10 (2003-04) - Identical
NBN EN 60749-10:2003 - Identical
NF EN 60749-10:2002 - Identical
I.S. EN 60749-10:2002 - Identical
IEC 60749-10 Ed. 1.0 - Identical
UNE EN 60749-10:2003 - Identical
EN 60749-10:2002 - Identical
