IEC 60749-10 : 1.0现行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 10: MECHANICAL SHOCK
出版：International Electrotechnical Committee
专家解读视频
Defines a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages.
PN EN 60749-10 : 2004 - Identical
CEI EN 60749-10 : 2004 - Identical
NEN EN IEC 60749-10 : 2002 - Identical
DS EN 60749-10 : 2002 COR 1 2003 - Identical
BS EN 60749-10 : 2002 - Identical
DIN EN 60749-10 : 2003 - Identical
