NF EN 60749-18:2003现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 18: Ionizing Radiation (total Dose)
出版：Association Francaise de Normalisation
专家解读视频
Covers a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 ([60]Co) gamma ray source.
Indice de Classement: C96-022-18 (06/2003) Supersedes NF EN 60749. (06/2007)
EN 60749-18:2003 - Identical
UNE EN 60749-18:2003 - Identical
SS EN 60749-18 Ed. 1 (2003) - Identical
IEC 60749-18 Ed. 1.0 - Identical
I.S. EN 60749-18:2003 - Identical
NBN EN 60749-18:2003 - Identical
DIN EN 60749-18 (2003-09) - Identical
BS EN 60749-18:2003 - Identical
SN EN 60749-18:2003 - Identical
