NBN EN 60749-18:2003现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 18: Ionizing Radiation (total Dose)
出版：Belgian Standards
专家解读视频
Covers a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 ([60]Co) gamma ray source.
UNE EN 60749-18:2003 - Identical
SS EN 60749-18 Ed. 1 (2003) - Identical
I.S. EN 60749-18:2003 - Identical
NF EN 60749-18:2003 - Identical
DIN EN 60749-18 (2003-09) - Identical
BS EN 60749-18:2003 - Identical
SN EN 60749-18:2003 - Identical
DIN EN 60749-18 : 2003 - Identical
BS EN 60749-18 : 2003 - Identical
SN EN 60749-18 : 2003 - Identical
UNE EN 60749-18 : 2003 - Identical
DIN EN 60749-18 : 2003 - Identical
I.S. EN 60749-18:2003 - Identical
EN 60749-18:2003 - Identical
