NF EN 60749-36:2003现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 36: Acceleration Steady State
出版：Association Francaise de Normalisation
专家解读视频
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.
Indice de classement: C96-022-36. (09/2003) Supersedes NF EN 60749. (06/2007)
SN EN 60749-36:2003 - Identical
BS EN 60749-36:2003 - Identical
DIN EN 60749-36 (2003-12) - Identical
NBN EN 60749-36:2004 - Identical
I.S. EN 60749-36:2003 - Identical
IEC 60749-36 Ed. 1.0 - Identical
SS EN 60749-36 Ed. 1 (2003) - Identical
UNE EN 60749-36:2004 - Identical
EN 60749-36:2003 - Identical
