NBN EN 60749-36:2004现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 36: Acceleration, Steady State
出版：Belgian Standards
专家解读视频
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.
Partially supersedes NBN EN 60749. (04/2004)
DIN EN 60749-36 (2003-12) - Identical
BS EN 60749-36:2003 - Identical
SN EN 60749-36:2003 - Identical
EN 60749-36:2003 - Identical
BS EN 60749-36 : 2003 - Identical
DIN EN 60749-36 : 2003 - Identical
I.S. EN 60749-36:2003 - Identical
DIN EN 60749-36 : 2003 - Identical
UNE EN 60749-36:2004 - Identical
NF EN 60749-36:2003 - Identical
I.S. EN 60749-36:2003 - Identical
SS EN 60749-36 Ed. 1 (2003) - Identical
