DIN EN 60749-36 (2003-12)现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 36: Acceleration, Steady State
出版：German Institute for Standardisation (Deutsches Institut für Normung)
专家解读视频
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.
Supersedes DIN EN 60749. (06/2005)
EN 60749-36:2003 - Identical
UNE EN 60749-36:2004 - Identical
NBN EN 60749-36:2004 - Identical
BS EN 60749-36:2003 - Identical
SN EN 60749-36:2003 - Identical
NF EN 60749-36:2003 - Identical
I.S. EN 60749-36:2003 - Identical
IEC 60749-36 Ed. 1.0 - Identical
SS EN 60749-36 Ed. 1 (2003) - Identical
