NEN EN IEC 60749-10:2002现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 10: Mechanical Shock
出版：Nederlands Normalisatie Instituut
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基本信息
标准编号： NEN EN IEC 60749-10:2002
发布时间：2002/9/1 0:00:00
标准类别：Standard
出版单位：Nederlands Normalisatie Instituut
标准页数：7
标准简介
Defines a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation.
标准备注
Partially supersedes NEN EN IEC 60749. (12/2002)
本标准替代的旧标准
