DIN EN 60749-2 (2003-04)现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 2: Low Air Pressure
出版：German Institute for Standardisation (Deutsches Institut für Normung)
专家解读视频
2003 [01/04/2003]
Supersedes DIN EN 60749 (06/2005)
I.S. EN 60749-2:2002 - Identical
NF EN 60749-2:2002 - Identical
NBN EN 60749-2:2003 - Identical
BS EN 60749-2:2002 - Identical
UNE EN 60749-2:2003 - Identical
SS EN 60749-2 Ed. 1 (2003) - Identical
IEC 60749-2 Ed. 1.0 - Identical
