EN 60749-14:2003现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 14: Robustness Of Terminations (Lead Integrity)
出版：European Committee for Standards - Electrical
专家解读视频
2003 [01/10/2003]
DIN EN 60749-14 (2004-07) - Identical
BS EN 60749-14:2003 - Identical
CEI EN 60749-14 Ed. 1 (2004) - Identical
OVE/ONORM EN 60749-14:2004 - Identical
NEN EN IEC 60749-14:2003 - Identical
DS EN 60749-14:2003 - Identical
PN EN 60749-14:2005 - Identical
IEC 60749-14 Ed. 1.0 - Identical
I.S. EN 60749-14:2003 - Identical
NF EN 60749-14:2004 - Identical
NBN EN 60749-14:2004 - Identical
UNE EN 60749-14:2004 - Identical
SS EN 60749-14 Ed. 1 (2004) - Identical
