I.S. EN 60749-5:2003被替代
Semiconductor Devices - Mechanical And Climatic Test Methods - Steady-state Temperature Humidity Bias Life Test
出版：National Standards Authority of Ireland
专家解读视频
Covers a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
UNE EN 60749-5:2003 - Identical
SS EN 60749-5 Ed. 1 (2003) - Identical
IEC 60749-5 Ed. 1.0 - Identical
NF EN 60749-5:2003 - Identical
DIN EN 60749-5 (2003-09) - Identical
BS EN 60749-5:2003 - Identical
SN EN 60749-5:2003 - Identical
NBN EN 60749-5:2004 - Identical
EN 60749-5:2017 - Identical
