I.S. EN 60749-4:2017现行
Semiconductor Devices - Mechanical and Climatic Test Methods Part 4: Damp Heat, Steady State, Highly Accelerated Stress Test (hast)
出版：National Standards Authority of Ireland
专家解读视频
Gives a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
BS EN 60749-4:2017 - Identical
EN 60749-4:2017 - Identical
UNE EN 60749-4 : 2003 - Identical
NBN EN 60749-4 : 2003 - Identical
DIN EN 60749-4 : 2016 - Identical
NF EN 60749-4 : 2002 - Identical
EN 60749-4 : 2017 - Identical
BS EN 60749-4 : 2002 - Identical
BS EN 60749-4 : 2017 - Identical
DIN EN 60749-4 : 2016 - Identical
