IEC 60749-29 Ed. 1.0被替代
Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test
出版：International Electrotechnical Committee
专家解读视频
Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing ""No Trouble Found"" and ""Electrical Overstress"" failures due to l
NEN EN IEC 60749-29:2004 - Identical
UNE EN 60749-29:2004 - Identical
BS EN 60749-29:2003 - Identical
CEI EN 60749-29 Ed. 1 (2004) - Identical
SS EN 60749-29 Ed. 1 (2004) - Identical
PN EN 60749-29:2006 - Identical
I.S. EN 60749-29:2003 - Identical
NF EN 60749-29:2004 - Identical
DIN EN 60749-29 (2004-07) - Identical
