SS EN 60749-17 Ed. 1 (2003)现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 17: Neutron Irradiation
出版：Standardiserings-Kommissionen I Sverige
专家解读视频
Performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
NF EN 60749-17:2003 - Identical
NBN EN 60749-17:2004 - Identical
DIN EN 60749-17 (2003-09) - Identical
BS EN 60749-17:2003 - Identical
SN EN 60749-17:2003 - Identical
I.S. EN 60749-17:2003 - Identical
IEC 60749-17 Ed. 1.0 - Identical
UNE EN 60749-17:2003 - Identical
EN 60749-17:2003 - Identical
