DIN EN 60749-17 (2003-09)现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 17: Neutron Irradiation
出版：German Institute for Standardisation (Deutsches Institut für Normung)
专家解读视频
Performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
BS EN 60749-17:2003 - Identical
SN EN 60749-17:2003 - Identical
NBN EN 60749-17:2004 - Identical
NF EN 60749-17:2003 - Identical
I.S. EN 60749-17:2003 - Identical
IEC 60749-17 Ed. 1.0 - Identical
SS EN 60749-17 Ed. 1 (2003) - Identical
UNE EN 60749-17:2003 - Identical
EN 60749-17:2003 - Identical
