IEC 60749-17 Ed. 1.0现行
Semiconductor devices - Mechanical and climatic test methods Part 17: Neutron irradiation
出版：International Electrotechnical Committee
专家解读视频
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
EN 60749-17:2003 - Identical
SS EN 60749-17 Ed. 1 (2003) - Identical
PN EN 60749-17:2005 - Identical
DIN EN 60749-17 (2003-09) - Identical
NF EN 60749-17:2003 - Identical
I.S. EN 60749-17:2003 - Identical
NEN EN IEC 60749-17:2003 - Identical
OVE/ONORM EN 60749-17:2003 - Identical
CEI EN 60749-17 Ed. 1 (2004) - Identical
SN EN 60749-17:2003 - Identical
BS EN 60749-17:2003 - Identical
