NF EN 60749-17:2003现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 17: Neutron Irradiation
出版：Association Francaise de Normalisation
专家解读视频
Performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
PR NF EN 60749-17 February 2002. Indice de Classement: C96-022-17. (01/2002)
SN EN 60749-17:2003 - Identical
BS EN 60749-17:2003 - Identical
DIN EN 60749-17 (2003-09) - Identical
NBN EN 60749-17:2004 - Identical
I.S. EN 60749-17:2003 - Identical
IEC 60749-17 Ed. 1.0 - Identical
SS EN 60749-17 Ed. 1 (2003) - Identical
UNE EN 60749-17:2003 - Identical
EN 60749-17:2003 - Identical
