DIN EN 60749-8 (2003-12)现行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 8: Sealing
出版：German Institute for Standardisation (Deutsches Institut für Normung)
专家解读视频
Applies to semiconductor devices (discrete devices and integrated circuits). It determines the leak rate of semiconductor devices.
Supersedes DIN EN 60749 (06/2005)
UNE EN 60749-8:2004 - Identical
SS EN 60749-8 Ed. 1 (2003) - Identical
IEC 60749-8 Ed. 1.0 - Identical
I.S. EN 60749-8:2003 - Identical
NF EN 60749-8:2003 - Identical
BS EN 60749-8:2003 - Identical
SN EN 60749-8:2003 - Identical
NBN EN 60749-8:2004 - Identical
