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IEC 60749-18:2019现行

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

出版：International Electrotechnical Committee

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基本信息

标准编号： IEC 60749-18:2019

标准类别：Test Method

出版单位：International Electrotechnical Committee

标准页数：0

标准简介

This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.

本标准替代的旧标准

IEC 60749-18 : 1.0

等同采用的国际标准

CEI EN IEC 60749-18 : 2019 - Identical

UNE-EN IEC 60749-18:2019 - Identical

PN-EN IEC 60749-18:2019-11 - Identical

BS EN IEC 60749-18 : 2019 - Identical

DS/EN IEC 60749-18 : 2019 - Identical

I.S. EN IEC 60749-18:2019 - Identical

EN IEC 60749-18 : 2019 - Identical

BS EN IEC 60749-18 : 2019 - Identical

DS/EN IEC 60749-18 : 2019 - Identical