CEI EN IEC 60749-18 : 2019现行
Semiconductor devices - Mechanical and climatic test methods Part 18: Ionizing radiation (total dose) Sommario
出版：Comitato Elettrotecnico Italiano
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基本信息
标准编号： CEI EN IEC 60749-18 : 2019
发布时间：2019/10/1 0:00:00
标准类别：Test Method
出版单位：Comitato Elettrotecnico Italiano
标准页数：0
标准简介
This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.
本标准替代的旧标准
等同采用的国际标准
IEC 60749-18:2019 - Identical
IEC 60749-18:2019 - Identical
EN IEC 60749-18 : 2019 - Identical
