IEC 60749-18 : 1.0已作废
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 18: IONIZING RADIATION (TOTAL DOSE)
出版：International Electrotechnical Committee
专家解读视频
Gives a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source.
SN EN 60749-18 : 2003 - Identical
I.S. EN 60749-18:2003 - Identical
DS EN 60749-18 : 2003 - Identical
DIN EN 60749-18 : 2003 - Identical
CEI EN 60749-18 : 2004 - Identical
PN EN 60749-18 : 2005 - Identical
NEN EN IEC 60749-18 : 2003 - Identical
UNE EN 60749-18 : 2003 - Identical
BS EN 60749-18 : 2003 - Identical
