NEN EN IEC 60749-18 : 2019现行
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
出版：Netherlands Standards
专家解读视频
基本信息
标准编号： NEN EN IEC 60749-18 : 2019
标准类别：Standard
出版单位：Netherlands Standards
标准页数：0
标准简介
This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.
本标准替代的旧标准
