DS/EN IEC 60749-18 : 2019现行
Semiconductor devices – Mechanical and climatic test methods – Part 18: Ionizing radiation (total dose)
出版：Danish Standards
专家解读视频
This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 ( 118 60Co) gamma ray source.
IEC 60749-18:2019 - Identical
EN IEC 60749-18 : 2019 - Identical
IEC 60749-18:2019 - Identical
EN IEC 60749-18 : 2019 - Identical
