BS EN 62373:2006现行
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
出版：British Standards Institution
专家解读视频
Defines a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET).
© British Standards Institution 2013
IEC 62373 : 1.0 - Identical
I.S. EN 62373:2006 - Identical
DIN EN 62373 : 2007 - Identical
IEC 62373 : 1.0 - Identical
SN EN 62373 : 2006 - Identical
EN 62373 : 2006 - Identical
DIN EN 62373 : 2007 - Identical
NBN EN 62373 : 2007 - Identical
I.S. EN 62373:2006 - Identical
NF EN 62373 : 2006 - Identical
IEC 62373 Ed. 1.0 - Identical
SN EN 62373:2006 - Identical
DIN EN 62373 (2007-01) - Identical
NBN EN 62373:2007 - Identical
NF EN 62373:2006 - Identical
I.S. EN 62373:2006 - Identical
