IEC 62373 Ed. 1.0现行
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
出版：International Electrotechnical Committee
专家解读视频
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
SN EN 62373:2006 - Identical
BS EN 62373:2006 - Identical
DIN EN 62373 (2007-01) - Identical
NF EN 62373:2006 - Identical
I.S. EN 62373:2006 - Identical
PN EN 62373:2006 - Identical
NEN EN IEC 62373:2006 - Identical
OVE/ONORM EN 62373:2007 - Identical
