NF EN 62373:2006现行
Bias-temperature Stability Test For Metal-oxide, Semiconductor, Field-effect Transistors (mosfet)
出版：Association Francaise de Normalisation
专家解读视频
Defines a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET).
Indice de classement: C96-051 PR NF EN 62373 July 2005 (07/2005)
NBN EN 62373:2007 - Identical
DIN EN 62373 (2007-01) - Identical
BS EN 62373:2006 - Identical
SN EN 62373:2006 - Identical
IEC 62373 Ed. 1.0 - Identical
I.S. EN 62373:2006 - Identical
DIN EN 62373 : 2007 - Identical
DIN EN 62373 : 2007 - Identical
BS EN 62373 : 2006 - Identical
IEC 62373 : 1.0 - Identical
I.S. EN 62373:2006 - Identical
