
Semiconductor Devices - Mechanical and Climatic Test Methods Part 15: Resistance to Soldering Temperature for Through-hole Mounted Devices
出版:National Standards Authority of Ireland

专家解读视频
Provides a test used to determine whether encapsulated solid state devices used for through-hole mounting can withstand the effects of the temperature to which they are subjected during soldering of their leads by using wave soldering or a soldering iron.
BS EN 60749-15:2010 - Identical
NF EN 60749-15:2011 - Identical
UNE EN 60749-15:2011 - Identical
UNE EN 60749-15 : 2011 - Identical
NF EN 60749-15 : 2011 - Identical
IEC 60749-15 : 2.0 - Identical
SN EN 60749-15 : 2003 - Identical
BS EN 60749-15 : 2010 - Identical
DIN EN 60749-15 : 2011 - Identical
EN 60749-15 : 2010 COR 2011 - Identical
NBN EN 60749-15 : 2011 - Identical
DIN EN 60749-15 : 2011 - Identical
SN EN 60749-15 : 2003 - Identical
BS EN 60749-15 : 2010 - Identical
NF EN 60749-15:2003 - Identical
NBN EN 60749-15:2011 - Identical
SS EN 60749-15 Ed. 2 (2011) - Identical
EN 60749-15:2010 - Identical