
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 15: Resistance To Soldering Temperature For Through-Hole Munted Devices
出版:Standardiserings-Kommissionen I Sverige

专家解读视频
2ED 2011 [04/05/2011]1ED 2003 [20/10/2003]
1ED 2003 is still active. (07/2011)
SN EN 60749-15:2003 - Identical
UNE EN 60749-15:2011 - Identical
DIN EN 60749-15 (2011-06) - Identical
NF EN 60749-15:2011 - Identical
NBN EN 60749-15:2011 - Identical
BS EN 60749-15:2010 - Identical
EN 60749-15:2010 - Identical
I.S. EN 60749-15:2010 - Identical