I.S. EN 60749-44:2016现行
Semiconductor Devices - Mechanical and Climatic Test Methods Part 44: Neutron Beam Irradiated Single Event Effect (see) Test Method for Semiconductor Devices
出版：National Standards Authority of Ireland
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基本信息
标准编号： I.S. EN 60749-44:2016
发布时间：2016/11/8 0:00:00
标准类别：Standard
出版单位：National Standards Authority of Ireland
标准页数：54
标准简介
Defines a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays.
