集成电路、微电子学 -环标网

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标准编号	标准名称	发布部门	发布日期	状态
NF EN 62215-3:2014	Integrated Circuits - Measurement Of Impulse Immunity - Part 3: Non-Synchronous Transient Injection Method	Associatio..	2014-03-01	现行
DS EN 62215-3:2013	Integrated Circuits - Measurement Of Impulse Immunity - Part 3: Non-Synchronous Transient Injection Method	Danish Sta..	2013-12-19	现行
BS EN 62215-3:2013	Integrated Circuits - Measurement Of Impulse Immunity - Part 3: Non-Synchronous Transient Injection Method	British St..	2013-10-31	现行
I.S. EN 62215-3:2013	Integrated Circuits - Measurement of Impulse Immunity Part 3: Non-synchronous Transient Injection Method (iec 62215-3:2013 (eqv))	National S..	2013-10-08	现行
DIN EN 62435-5 (2013-10)	Electronic components - Long-term storage of electronic semiconductor devices Part 5: Die & Wafer Devices (IEC 47/2174/CD:2013)	German Ins..	2013-10-01	废止
DIN EN 62435-2 (2013-10)	Electronic components - Long-term storage of electronic semiconductor devices Part 2: Deterioration Mechanisms (IEC 47/2173/CD:2013)	German Ins..	2013-10-01	废止
DIN EN 62435-1 (2013-10)	Electronic components - Long-term storage of electronic semiconductor devices Part 1: General (IEC 47/2172/CD:2013)	German Ins..	2013-10-01	废止
NEN EN IEC 62215-3:2013	Integrated Circuits - Measurement Of Impulse Immunity - Part 3: Non-Synchronous Transient Injection Method	Nederlands..	2013-10-01	现行
NF EN 62433-2:2013	Emc Ic Modelling - Part 2: Models Of Integrated Circuits For Emi Behavioural Simulation - Conducted Emissions Modelling (Icem-Ce)	Associatio..	2013-09-01	被替代
GOST R 54844:2011	Integrated Microcircuits - Basic Dimensions	Interstand..	2013-09-01	现行
GOST R 54843:2011	Microsystem Technology Products - Sensitive Elements Of Microelectromechanical Transducers Of Physical Quantities - Generic Specifications	Interstand..	2013-09-01	现行
NF EN 165000-5:2013		Associatio..	2013-08-01	被替代
IEC 62215-3 Ed. 1.0	Integrated circuits - Measurement of impulse immunity Part 3: Non-synchronous transient injection method	Internatio..	2013-07-17	现行
EIA JESD 22-A100:2013	Cycled Temperature-Humidity-Bias Life Test	Joint Elec..	2013-07-01	现行
CEI EN 62132-8 Ed. 1 (2013)	Integrated Circuits - Measurement Of Electromagnetic Immunity - Part 8: Measurement Of Radiated Immunity - Ic Stripline Method	Comitato E..	2013-06-01	现行
IEEE 1149.1:2013	Test Access Port And Boundary-Scan Architecture	Institute ..	2013-05-13	现行
NF EN 190107:2013	Family Specification: Ttl Fast Digital Integrated Circuits - Series 54F, 74F	Associatio..	2013-04-01	现行
NF EN 190109:2013		Associatio..	2013-04-01	现行
NF EN 190000:2013	Harmonized System Of Quality Assessment For Electronic Components - Generic Specification: Monolithic Integrated Circuits	Associatio..	2013-04-01	现行
NF EN 190101:2013	Family Specification: Digital Integrated Ttl Circuits - Series 54, 64, 74, 84	Associatio..	2013-04-01	现行

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