IEEE 1149.1:2013现行
Test Access Port And Boundary-Scan Architecture
出版：Institute of Electrical and Electronics Engineers
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基本信息
标准编号： IEEE 1149.1:2013
发布时间：2013/5/13 0:00:00
标准类别：Standard
出版单位：Institute of Electrical and Electronics Engineers
标准页数：444
标准简介
Covers a general overview of the operation of a component compatible with this standard and provides a background to the detailed discussion in later clauses.
标准备注
Supersedes IEEE 1149.1B. (09/2001) Supersedes IEEE DRAFT 1149.1. (02/2005)
