EIA JESD 22-A100:2013现行
Cycled Temperature-Humidity-Bias Life Test
出版：Joint Electronics Device Engineering Council (JEDEC)
专家解读视频
基本信息
标准编号： EIA JESD 22-A100:2013
发布时间：2013/7/1 0:00:00
标准类别：Standard
出版单位：Joint Electronics Device Engineering Council (JEDEC)
标准页数：12
标准简介
Aims to evaluate the reliability of non-hermetic, packaged solid state devices in humidity environments when surface condensation is likely. Normally performed on cavity packages (e.g., MQUADs, lidded ceramic pin grid arrays, etc.) as an alternative to JESD22-A101 or JESD22-A110.
标准备注
Supersedes EIA JESD 22 (07/2004)
本标准替代的旧标准
