IEC 62215-3 Ed. 1.0现行
Integrated circuits - Measurement of impulse immunity Part 3: Non-synchronous transient injection method
出版：International Electrotechnical Committee
专家解读视频
基本信息
标准编号： IEC 62215-3 Ed. 1.0
发布时间：2013/7/17 0:00:00
标准类别：Standard
出版单位：International Electrotechnical Committee
标准页数：66
标准简介
IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.
