半导体材料 -环标网

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标准编号	标准名称	发布部门	发布日期	状态
KS D ISO TR 14321:2011	Sintered metal materials, excluding hardmetals-Metallographic preparation and examination	Korean Sta..	2011-09-30	被替代
NF EN 62047-4:2011	Semiconductor Devices - Micro-Electromechanical Devices - Part 4: Generic Specifications For Mems	Associatio..	2011-09-01	现行
ASTM F1894-98(2011)	Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness	American S..	2011-06-01	现行
ASTM F2113-01(2011)	Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications	American S..	2011-06-01	现行
OVE/ONORM EN 60146-1-1:2011	Semiconductor Converters - General Requirements And Line Commutated Converters - Part 1-1: Specification Of Basic Requirements	Osterreich..	2011-05-01	现行
KS D 0267:2011	Estimation of Boron Content in Silicon	Korean Sta..	2011-03-25	现行
PD IEC TR 60146-1-2:2011	Semiconductor converters. General requirements and line commutated converters. Application guide	British St..	2011-02-28	现行
NEN NPR IEC/TR 60146-1-2:2011	Semiconductor Converters - General Requirements And Line Commutated Converters - Part 1-2: Application Guide	Nederlands..	2011-02-01	现行
IEC/TR 60146-1-2 Ed. 4.0	Semiconductor converters - General requirements and line commutated converters Part 1-2: Application guide	Internatio..	2011-01-26	现行
ASTM F980-10e1	Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices	American S..	2010-12-01	被替代
SS EN 60146-1-1 Ed. 2 (2010)	Semiconductor Convertors - General Requirements And Line Commutated Convertors - Part 1-1: Specifications Of Basic Requirements	Standardis..	2010-11-22	现行
PN EN 60146-1-1:2010	Semiconductor Convertors - General Requirements And Line Commutated Convertors - Part 1-1: Specifications Of Basic Requirements	Polish Com..	2010-11-03	现行
NF EN 62047-6:2010	Semiconductor Devices - Micro-Electromechanical Devices - Part 6: Axial Fatigue Testing Methods Of Thin Film Materials	Associatio..	2010-09-01	现行
BS EN 60146-1-1:2010	Semiconductor converters. General requirements and line commutated converters. Specification of basic requirements	British St..	2010-08-31	现行
NEN EN IEC 60146-1-1:2010	Semiconductor Converters - General Requirements And Line Commutated Converters - Part 1-1: Specification Of Basic Requirements	Nederlands..	2010-08-01	现行
I.S. EN 60146-1-1:2010	Semiconductor Converters - General Requirements and Line Commutated Converters Part 1-1: Specification of Basic Requirements	National S..	2010-07-19	现行
DIN 50451-5 (2010-03)	Testing Of Materials For Semiconductor Technology - Determination Of Trace Elements In Liquids - Part 5: Guideline For The Selection Of Materials And Testing Of Their Suitability For Apparatus For Sampling And Sample Preparation For The Determination Of Trace Elements In The Range Of Micrograms Per Kilogram And Nanograms Per Kilogram	German Ins..	2010-03-01	现行
NF EN 62047-9:2010	Semiconductor Devices - Micro-electromechanical Devices - Part 9: Wafer To Wafer Bonding Strength Measurement For Mems	Associatio..	2010-01-01	被替代
KS D ISO 9717:2009	Phosphate conversion coatings for metals-Method of specifying requirements	Korean Sta..	2009-12-30	被替代
DIN 50455-1 (2009-10)	Testing Of Materials For Semiconductor Technology - Methods For Characterizing Photoresists - Part 1: Determination Of Coating Thickness With Optical Methods	German Ins..	2009-10-01	现行

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